High-Frequency Characteristic Measurement for Three-Dimensional Structures up to 110 GHz TOKYO — Kioxia Corporation, a world leader in memory solutions, and MoDeCH Inc., a leading developer of modeling and design technology, announced the devel
TOKYO -- Kioxia Corporation, a world leader in memory solutions, and MoDeCH Inc., a leading developer of modeling and design technology, announced the development of an industry first probing system for high-frequency characteristic measurement for three-dimensional (3D) objects up to 110 GHz at The European Microwave Conference (EuMC) on September 26(1). Read More
