Kioxia and MoDeCH Develop a Three-Dimensional Probing System
TOKYO -- Kioxia Corporation, a world leader in memory solutions, and MoDeCH Inc., a leading developer of modeling and design technology, announced the development of an industry first probing system for high-frequency characteristic measurement for three-dimensional (3D) objects up to 110 GHz at The European Microwave Conference (EuMC) on September 26(1). Read More
Kioxia and MoDeCH Develop a Three-Dimensional Probing System
Kioxia and MoDeCH Develop a Three-Dimensional Probing System
Kioxia and MoDeCH Develop a Three-Dimensional Probing System
Kioxia and MoDeCH Develop a Three-Dimensional Probing System
Kioxia and MoDeCH Develop a Three-Dimensional Probing System
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